An experimental approach to the determination of the surface ionization φ(0) in electron probe microanalysis

X-Ray Spectrometry

Volumn 30, Issue 4, 2001, Pages 216-229

  Bastin, G F ^a   Dijkstra, J M ^a   Heijligers, H J M ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON PROBE MICROANALYSIS; IONIZATION; PROBES; THIN FILMS;

ALUMINUM FILM; ELECTRON PROBE MICROANALYSES; ELECTRON-PROBE MICROANALYSIS; EXPERIMENTAL APPROACHES; FILM-THICKNESS; KΑ; PALLADIUM FILMS; SURFACE-IONIZATION; THIN FILMS MEASUREMENTS; X-RADIATION;

FILM THICKNESS;

EID: 0042693148     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.491     Document Type: Article

References (43)

1. Castaing R, Descamps J. J. Phys. Rad. 1955; 16: 304.
2. Shimizu R, Murata K, Shinoda G. In IV Congrès International sur l'Optique des Rayons X et la Microanalyse/4th ICXOM (Orsay, 1965), Castaing R, Deschamps P, Philibert J (eds). Hermann: Paris, 1966; 127-138.
3. Castaing R, Hénoc J. In IV Congrès International sur l'Optique des Rayons X et la Microanalyse/4th ICXOM (Orsay, 1965), Castaing R, Deschamps P, Philibert J (eds). Hermann: Paris, 1966; 120-126.
4. Vignes A, Dez G. J. Phys. D: Appl. Phys. 1968; 1: 1309.
5. Reuter W. In Proceedings of the 6th International Conference on X-Ray Optics and Microanalysis 1971. University of Tokyo Press: Tokyo, 1972; 121-130.
6. Brown JD, Parobek L. X-Ray Spectrom. 1976; 5: 36.
7. Bastin GF, Heijligers HJM. X-Ray Spectrom. 1986; 15: 135.
8. Bastin GF, Heijligers HJM. Scanning 1990; 12: 225.
9. Bastin GF, Heijligers HJM. Scanning 1991; 13: 325.
10. Bastin GF, Heijligers HJM. Mikrochim. Acta 1992; Suppl. 12: 19.
11. Pouchou J-L, Pichoir F. Rech. Aérosp. 1984; 3(13):, 1984; 5(5): 349.
12. Pouchou J-L, Pichoir F. Rech. Aérosp. 1984; 3(13):, 1984; 5(5): 349.
13. Pouchou J-L, Pichoir F. In Proceedings of 11th ICXOM, London, Ontario, Canada, Brown JD, Packwood RH (eds). Graphic Services: U.W.O., London, Canada, 1986; 249-253.
14. Pouchou J-L, Pichoir F, Boivin D. In Proceedings of 12th ICXOM, Cracow (Poland), 1989, Jasienska S, Maksymowic Z (eds). Cracow, Acad. of Mining and Metallurgy (1990) 52. Also available as ONERA Report TP 1989-57 "Further Improvement in Quantitation Procedures for x-ray Microanalysis", 1989.
15. Pouchou J-L, Pichoir F, Boivin D. In Proceedings of 12th ICXOM, Cracow (Poland), 1989, Jasienska S, Maksymowic Z (eds). Cracow, Acad. of Mining and Metallurgy (1990) 52. Also available as ONERA Report TP 1989-57 "Further Improvement in Quantitation Procedures for x-ray Microanalysis", 1989.
16. Bastin GF, Dijkstra JM, Heijligers HJM. X-ray Spectrom. 1998; 27: 3.
17. Love G, Cox MGC, Scott VD. J. Phys. D: Appl. Phys. 1978; 11: 23.
18. Packwood RH, Brown JD. X-ray Spectrom. 1981; 10: 138.
19. Ichimura S, Shimizu R, Langeron JP. Surf. Sci. 1983; 124: L49.
20. Rehbach W. PhD Thesis. R.W.T.H., Aachen, 1987.
21. Tirira Saá JH, Riveros JA. X-Ray Spectrom. 1987; 16: 27.
22. August H-J, Wernisch J. Scanning 1990; 12: 14.
23. Cazaux J. Mikrochim. Acta 1992; Suppl. 12: 37.
24. Merlet C. X-Ray Spectrom. 1992; 21: 229.
25. Cazaux J. Microsc. Microanal. Microstruct. 1992; 3: 271.
26. Merlet C, Jbara O, Rondot S, Cazaux J. Surf. Interface Anal. 1992; 19: 192.
27. Benhayoune H, Jbara O, Thomas X, Mouze D, Cazaux J. Surf. Interface Anal. 1993; 20: 600.
28. Kyser DF, Murata K. In: Proceedings of a Workshop on the Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy, Heinrich KFJ, Newbury DE, Yakowitz H (eds). NBS Special Publication 460. National Bureau of Standards: Washington, DC, 1976; 129-138.
29. Love G, Cox MGC, Scott VD. J. Phys. D: Appl. Phys. 1977; 10: 7.
30. Reimer L, Stelter D. Scanning 1986; 8: 265.
31. Ammann N. MSc Thesis. R.W.T.H. Aachen, 1989.
32. Bastin GF, Dijkstra JM, Heijligers HJM, Klepper D. Microbeam Anal. 1993; 2: 29.
33. Bastin GF, Heijligers HJM. X-Ray Spectrom. 2000; 29: 212.
34. Bastin GF, Heijligers HJM. X-Ray Spectrom. 2000; 29: 373.
35. Love G, Scott VD. J. Phys. D: Appl. Phys. 1978; 11: 1369.
36. Darlington EH. J. Phys. D: Appl. Phys. 1975; 8: 85.
37. Heinrich KFJ. In IV Congrès International sur l'Optique des Rayons X et la Microanalyse/4th ICXOM (Orsay, 1965), Castaing R, Deschamps P, Philibert J (eds). Hermann: Paris, 1966; 159-167.
38. Rehbach W, Karduck P. In Microbeam Analysis, Newbury DE (ed.) San Francisco Press: San Francisco, 1988; 285-289.
39. Hunger H-J, Küchler L. Phys. Status Solidi A 1979; 56: K45.
40. Bastin GF, Heijligers HJM. Quantitative Electron Probe Microanalysis of Boron in binary Borides Internal Report. University of Technology: Eindhoven, 1st edn, 1986; 2nd edn, 1997.
41. Bastin GF, Heijligers HJM. Quantitative Electron Probe Microanalysis of Carbon in binary Carbides Internal Report. University of Technology: Eindhoven, 1st edn, 1984; 2nd edn, 1990.
42. Bastin GF, Heijligers HJM. Quantitative Electron Probe Microanalysis of Nitrogen in binary Nitrides Internal Report. University of Technology: Eindhoven, 1988.
43. Bastin GF, Heijligers HJM. Quantitative Electron Probe Microanalysis of Oxygen in binary Oxides Internal Report. University of Technology: Eindhoven, 1989.