메뉴 건너뛰기
Journal of Solid State Chemistry
Volumn 154, Issue 1, 2000, Pages 177-187
Quantitative electron probe microanalysis of boron
Author keywords

EPMA; Quantitative microanalysis of boron; Ultra light elements
Indexed keywords

BORON;
EID: 0033662347     PISSN: 00224596     EISSN: None     Source Type: Journal    
DOI: 10.1006/jssc.2000.8832     Document Type: Article
Times cited : (27)
References (23)
  • 4
    • 0005666401 scopus 로고
    • 'Proceedings of the 11th International Congress on X-ray Optics and Microanalysis' (J. D. Brown and R. H. Packwood, Eds.), Graphic Services, U.W.O, London, Canada
    • (1986) , pp. 249
    • Pouchou, J.L.1    Pichoir, F.2
  • 5
    • 0346597426 scopus 로고
    • 'Proceedings of the 12th International Congress on X-ray Optics and Microanalysis, Cracow, Poland 1989,' (S. Jasienska and L. J. Maksymowicz, Eds.,), Cracow, Acad. of Mining and Metallurgy. Also available as ON-ERA report TP 1989-157
    • (1990) , pp. 52
    • Pouchou, J.L.1    Pichoir, F.2    Boivin, D.3
  • 6
    • 0002003383 scopus 로고
    • 'Electron Probe Quantitation, Workshop at the Natonal Bureau of Standards, Gaithersburg, Maryland 1988' (K. F. J. Heinrich and D. E. Newbury, Eds.), Plenum, New York
    • (1991) , pp. 145-161
    • Bastin, G.F.1    Heijligers, H.J.M.2
  • 9
    • 0004280545 scopus 로고
    • 'Electron Probe Quantitation, Workshop at the Natonal Bureau of Standards, Gaithersburg, Maryland, 1988' (K. E. J. Heinrich and D. E. Newbury, Eds.), Plenum, New York
    • (1991) , pp. 19-30
    • Scott, V.D.1    Love, G.2
  • 15
    • 0004186893 scopus 로고
    • 'The Electron Microprobe' T. D. McKinley, et al. Eds.), Wiley, New York
    • (1966) , pp. 296
    • Heinrich, K.F.J.1
  • 16
    • 0001907758 scopus 로고
    • 'Proceedings of the 11th International Congress on X-ray Optics and Microanalysis' (J. D. Brown and R. H. Packwood, Eds.) Graphic Services, U.W.O, London, Canada
    • (1986) , pp. 67
    • Heinrich, K.F.J.1
  • 21
    • 0006958330 scopus 로고
    • 'X-ray emission spectroscopy' (P. Day, Ed.), Emission and Scattering Techniques Series C, NATO Adv. Study Inst., D. Reidel Publishing Co.
    • (1981) , pp. 103-151
    • Wiech, G.1
  • 22
    • 0001847221 scopus 로고
    • 'X-Ray Spectrometry in Electron Beam Instruments,' (D. Williams, J. Goldstein, and D. Newbury, Eds.), Plenum, New York
    • (1995) , pp. 239
    • Bastin, G.F.1    Heijligers, H.J.M.2

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.