X-ray absorption spectroscopy for icf target characterization

Fusion Science and Technology

Volumn 55, Issue 4, 2009, Pages 367-372

  Fong, J R ^a   Eddinger, S A ^a   Huang, H ^a   Moreno, K A ^a  

^a GENERAL ATOMICS   (United States)

Author keywords

Absorption edge; Metrology; X ray

Indexed keywords

ATOMS; INERTIAL CONFINEMENT FUSION; MEASUREMENTS; RADIOGRAPHY; X RAY ABSORPTION SPECTROSCOPY; X RAYS;

ABSORPTION EDGES; AREAL DENSITIES; ATOMIC NUMBERS; DOPANT CONCENTRATIONS; HIGH ENERGY DENSITIES; NO REFERENCES; NONUNIFORMITY; X RAY FLUORESCENCE;

X RAY RADIOGRAPHY;

EID: 67649559590     PISSN: 15361055     EISSN: None     Source Type: Journal    
DOI: 10.13182/FST55-367     Document Type: Article

References (4)

1. S.W. HAAN et al., "Update on NIF Indirect Drive Ignition Target Fabrication Specifications," Fusion Sci. Technol., 45, 69 (2004).
2. H. HUANG, A. NIKROO, R. B. STEPHENS, S. A. EDDINGER, D. R. WALL, K. A. MORENO, and H. W. XU, "Element-Specific Profiling for ICF Ablator Capsules with Mixed Dopant and Impurities," Fusion Sci. Technol. 55, 356 (2009).
3. H. HUANG, R. B. STEPHENS, S. A. EDDINGER, J. GÜNTHER, A. NIKROO, K. C. CHEN, and H. W. XU, "Nondestructive Quantitative Dopant Profiling Technique by Contact Radiography," Fusion Sci. Technol., 49, 650 (2006).
4. H. HUANG et al., "Quantitative Radiography: Film Model Calibration and Dopant/Impurity Measurement in ICF Ablators," Fusion Sci. Technol., 51, 530 (2007).