Characterization of high temperature piezoelectric crystals with an ordered langasite structure

Journal of Applied Physics

Volumn 105, Issue 11, 2009, Pages

  Zhang, Shujun ^a   Zheng, Yanqing ^b   Kong, Haikuan ^b   Xin, Jun ^b   Frantz, Eric ^a   Shrout, Thomas R ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b SHANGHAI INSTITUTE OF CERAMICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CATION ORDERING; DIELECTRIC PERMITTIVITIES; DISORDERED STRUCTURES; ELECTRICAL RESISTIVITY; ELEVATED TEMPERATURE; HIGH TEMPERATURE; HIGH-TEMPERATURE SENSING; LANGASITE; LANGASITE STRUCTURES; LOW COSTS; MECHANICAL QUALITY FACTORS; ORDERS OF MAGNITUDE; PIEZOELECTRIC COEFFICIENT; PIEZOELECTRIC CRYSTALS; PIEZOELECTRIC PROPERTY; PIEZOELECTRIC SINGLE CRYSTALS; THERMALLY STABLE;

CALCIUM; CRYSTAL STRUCTURE; ELECTRIC RESISTANCE; GALLIUM; HIGH TEMPERATURE APPLICATIONS; LANTHANUM; PIEZOELECTRIC TRANSDUCERS; PIEZOELECTRICITY; POSITIVE IONS; SILICON; SILICON COMPOUNDS;

SINGLE CRYSTALS;

EID: 67649510441     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3142429     Document Type: Article

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