Thickness scalability of large volume cadmium zinc telluride high resolution radiation detectors

Journal of Applied Physics

Volumn 105, Issue 11, 2009, Pages

  Awadalla, S A ^a   Chen, H ^a   MacKenzie, J ^a   Lu, P ^a   Iniewski, K ^a   Marthandam, P ^a   Redden, R ^a   Bindley, G ^a   He, Z ^b   Zhang, F ^b  

^a REDLEN TECHNOLOGIES   (Canada)

^b UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM ZINC TELLURIDES; CDZNTE CRYSTALS; ENERGY RESOLUTIONS; FRISCH GRIDS; GROWTH PROCESS; HIGH RESOLUTION; MONOLITHIC DETECTORS; POSTGROWTH ANNEALING; SLICED WAFERS; THICKNESS SCALABILITY; TRAVELING HEATER METHOD; VOLUME DETECTORS; WORK FOCUS;

CADMIUM; CADMIUM ALLOYS; CADMIUM COMPOUNDS; METAL CASTINGS; SCALABILITY; TRANSPORT PROPERTIES; ZINC;

RADIATION DETECTORS;

EID: 67649497817     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3133222     Document Type: Article

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