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Volumn 441, Issue 3, 2000, Pages 459-467
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Measurement of material uniformity using 3-D position sensitive CdZnTe gamma-ray spectrometers
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Author keywords
[No Author keywords available]
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Indexed keywords
CESIUM;
EFFICIENCY;
ELECTRON TRAPS;
GAMMA RAYS;
IONIZATION;
SEMICONDUCTING CADMIUM COMPOUNDS;
SEMICONDUCTOR DEVICES;
CADMIUM ZINC TELLURIDE;
FULL ENERGY PEAK EFFICIENCY;
POSITION SENSITIVE GAMMA RAY DETECTORS;
THREE DIMENSIONAL POSITION SENSITIVITY;
GAMMA RAY SPECTROMETERS;
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EID: 0033905632
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(99)00860-8 Document Type: Article |
Times cited : (24)
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References (8)
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