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Volumn 441, Issue 3, 2000, Pages 459-467

Measurement of material uniformity using 3-D position sensitive CdZnTe gamma-ray spectrometers

Author keywords

[No Author keywords available]

Indexed keywords

CESIUM; EFFICIENCY; ELECTRON TRAPS; GAMMA RAYS; IONIZATION; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTOR DEVICES;

EID: 0033905632     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(99)00860-8     Document Type: Article
Times cited : (24)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.