Real structure effects in X-ray waveguide optics: The influence of interfacial roughness and refractive index profile on the near-field and far-field distribution

Optics Communications

Volumn 282, Issue 16, 2009, Pages 3250-3256

  Osterhoff, Markus ^a   Salditt, Tim ^a  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL SOLUTIONS; ARBITRARY SHAPE; FABRICATION IMPERFECTIONS; FAR FIELD DISTRIBUTION; FAR-FIELD INTENSITY DISTRIBUTION; GENERALIZED INDEX; INDEX PROFILE; INTERFACIAL ROUGHNESS; NEAR-FIELD; NUMEROV'S METHODS; OPTICAL PERFORMANCE; OPTICAL TREATMENT; REAL STRUCTURE; REFRACTIVE INDEX PROFILES; SHAPE FUNCTIONS; X-RAY WAVEGUIDES;

FUNCTION EVALUATION; REFRACTIVE INDEX;

WAVEGUIDES;

EID: 67649361376     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2009.05.008     Document Type: Article

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