Background of x-ray nanophotonics based on the planar air waveguide resonator

X-Ray Spectrometry

Volumn 36, Issue 6, 2007, Pages 381-397

  Egorov, V K ^a   Egorov, E V ^a  

^a RUSSIAN ACADEMY OF SCIENCES   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

RESONATORS; WAVEGUIDES;

AIR WAVEGUIDES; RESONANCE MODEL; RESONANCE STRUCTURE; SPATIAL COHERENCE; WAVEGUIDE RESONANCE; WAVEGUIDE-RESONATORS; X-RAY FLUX; X-RAY WAVEGUIDES;

NANOPHOTONICS;

EID: 36549080054     PISSN: 00498246     EISSN: 10974539     Source Type: Journal    
DOI: 10.1002/xrs.989     Document Type: Article

References (46)

1. Reed SJB. Electron Microprobe Analysis. Cambridge University Press: Cambridge, 1975; 401.
2. Cohen SH, Brag MT (eds). Atomic Force Microscopy Scanning Tunneling Microscopy. Plenum: New York, 1994; 450.
3. Bird JR, Williams JS. Ion Beams for Material Analysis. Academic Press: Sidney, 1989; 721.
4. Harrick NJ. Internal Reflection Spectroscopy. Wiley: New York, 1957; 289.
5. Feldman LC, Mayer JW. Fundamentals of Surface and Thin Film Analysis. North-Holland Press: Amsterdam, 1986; 315.
6. Johansson SAE, Compbel JL. PIXE: A Novel Technique for Elemental Analysis. Wiley: Chichester, 1988; 347.
7. Feldman LC, Mayer JW, Picraux ST. Material Analysis by Ion Channeling (Submicron Crystallography). Academic Press: New York, 1982; 300.
8. Wiesendanger R (ed). Scanning Probe Microscopy: Analytical Methods. Springer: New York, 1998; 216.
9. Turner A. J. Phys. Radium 1950; 11: 444.
10. Egorov VK, Egorov EV. Spectrochim. Acta 2004; B 59:1049.
11. Klockenkamper A. Total Reflection X-Ray Fluorescence Analysis. Wiley: New York, 1997; 245.
12. Holy V, Pietsch U, Bautmach T. X-Ray Scattering from Thin Films. Springer: Berlin, 1998; 190.
13. Klug HP, Alexander LE. X-Ray Diffraction Procedure. Wiley: New York, 1074; 966.
14. de Boer DKG, van den Hoogenhof WW. Spectrochim. Acta 1991; B 46:1323.
15. Jenkins R, Gould RW, Gedcke D. Quantitative X-Ray Spectrometry. Marcel Dekker Press: New York, 1995; 484.
16. Hoover RB, Kumakhov MA (eds). Proceeding of SPIE 2002; 4765: 220.
17. Takano H, Suzuki Y, Takeuchi A. Jpn. J. Appl. Phys. 2003; 42: L132.
18. Snigerev A, Kohn V, Snigereva I, Lenginer B. Nature 1996; 384: 49.
19. Tsuji K, Injuk J, van Grieken R (eds). X-ray Spectrometry: Resent Technological Advances. Wiley: Chichester, 2004; 603.
20. Mingazin T, Zelenov V, Lejkin V. lnstrum. Exp. Tech. 1981; 24(1 part 2): 244.
21. Egorov VK, Egorov EV. X-Ray Spectrom. 2004; 33: 360.
22. Bedzyk MJ, Bommarito GM, Schildraut JS. Phys. Rev. Lett. 1989; 62(12): 1376.
23. Lotsch HKV. J. Opt. Soc. Am. 1968; 58(4): 551.
24. Born M, Wolf E. Principles of Optics. Pergamon Press: Oxford, 1993; 808.
25. Bohm M. Quantum Theory. Prentice-Hall: New York, 1952; 755.
26. Blochin M. Physik der Runtgenstrahlen. Verlag der Technik: Berlin, 1957; 535.
27. Landau LD, Lifshitz EM. Electrodynamics of Continues Medium. Addition-Wesley: Reading, 1965; 586.
28. Egorov VK, Egorov EV. Proc. SPIE 2001; 4502:148.
29. Egorov VK, Egorov EV. Proc. SPIE 2002; 4765:44.
30. Egorov VK, Egorov EV. X-ray planar waveguide-resonator as a possible competitor of synchrotron source radiation. Investigation in Russia (Electron Magazine) 2003; 141: 1679 (in Russian), http://zhurnal.ape.relarn. ru/articles/2003/141.pdf.
31. Zheludeva SU, Kovalchuk MV, Novikova NN, Sosfenov A, Malysheva N, Salashenko N, Platonor YU, Aksakhalyn A. Kristallografija 1995; 40(1): 145 (in Russian).
32. Zheludeva S, Kovalchuk M, Novikova N. Spectrochim. Acta 2001; B 56(11): 2019.
33. Francon M, Slansky S. Coherence en Optique. National de la Recherche Scientifique: Paris, 1965; 72.
34. Lanterborn W, Kurz T, Wiesenfeldt M. Coherent Optics. Springer: Berlin, 1995; 300.
35. Mandel L, Wolf E. Rev. Mod. Phys. 1965; 37(2): 232.
36. Mandel L, Wolf E. Optical Coherence and Quantum Opties. Cambridge University Press: Cambridge, 1995; 837.
37. Rocca JJ, Moreno CH, Markoni MC, Kanizay K. Opt. Lett. 1999; 24(6): 420.
38. Egorov VK, Egorov EV. Mat. Res. Soc. Symp. Proc. 2002; 716:189.
39. Egorov VK, Egorov EV. Discovery of a planar waveguide for an X-ray radiation//Los Alamos e-print archive, 2001; 27, http://arxiv.org/PS_cache/ physics/pdf/0101/0101059.pdf.
40. Egorov VK, Egorov EV, Kondakov AS. Poverkhnost, Surface (X-ray, Synch. and Neutron Investigations) 2003; 15(5): 28 (In Russian).
41. Egorov VK, Kondratiev OS, Zuev AP, Egorov EV. Adv. X-Ray Anal. 2000; 43:408.
42. Egorov VK, Zuev AP, Malukov BA. Isvestia VUZoV, Tsvetnaja Metallurgy 1997; 15(5): 54 (in Russian).
43. Vyatkin AF, Egorov VK, Egorov EV. Mat. Res. Soc. Symp. Proc. 2000; 585:183.
44. Bertin EP. Principles and Practice of X-Ray Spectrometric Analysis. Plenum: New York, 1975; 1095.
45. Schmeling M. Spectrochim. Acta 2001; B 56(11): 2127.
46. Kaye GW, Laby TH. Tables of Physics and Chemical Constants. Longmans: London, 1961; 245.