Local imaging of an electrochemical active/inactive region on a conductive carbon surface by using scanning electrochemical microscopy

Analytical Sciences

Volumn 25, Issue 5, 2009, Pages 645-651

  Ueda, Akio ^a,b   Kato, Dai ^b   Sekioka, Naoyuki ^c   Hirono, Shigeru ^d   Niwa, Osamu ^a,b,c  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^c UNIVERSITY OF TSUKUBA   (Japan)

^d MES Afty Corporation   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON; ELECTRODES; ELECTRON TRANSITIONS; ELECTRON TRANSPORT PROPERTIES; OXYGEN; PHOTORESISTS; PLASMA APPLICATIONS; SCANNING ELECTRON MICROSCOPY;

ELECTRON TRANSFER RATES; OXYGEN CONTAINING GROUPS; OXYGEN FUNCTIONAL GROUPS; OXYGEN PLASMA TREATMENTS; PATTERNED PHOTORESISTS; SCANNING ELECTROCHEMICAL MICROSCOPY; SURFACE FUNCTIONAL GROUPS; TOPOGRAPHICAL FEATURES;

ANALYTIC EQUIPMENT;

EID: 67649264380     PISSN: 09106340     EISSN: 13482246     Source Type: Journal    
DOI: 10.2116/analsci.25.645     Document Type: Article

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