-
1
-
-
43149122569
-
-
C. S. Tan, R. J. Gutmann, and L. R. Reif, Eds, New York: Springer
-
C. S. Tan, R. J. Gutmann, and L. R. Reif, Eds., Wafer Level 3-D ICs Process Technology. New York: Springer, 2008.
-
(2008)
Wafer Level 3-D ICs Process Technology
-
-
-
2
-
-
46049113542
-
Three dimensionally stacked NAND flash memory technology using stacking single crystal Si layers on ILD and TANOS structure for beyond 30 nm node
-
S. M. Jung, J. Jang, W. Cho, H. Cho, J. Jeong, Y. Chang, J. Kim, Y. Rah, Y. Son, J. Park, M. Song, K. Kim, J. Lim, and K. Kim, "Three dimensionally stacked NAND flash memory technology using stacking single crystal Si layers on ILD and TANOS structure for beyond 30 nm node," in Tech. Dig. Int. Electron Devices Meeting, 2006, pp. 1-4.
-
(2006)
Tech. Dig. Int. Electron Devices Meeting
, pp. 1-4
-
-
Jung, S.M.1
Jang, J.2
Cho, W.3
Cho, H.4
Jeong, J.5
Chang, Y.6
Kim, J.7
Rah, Y.8
Son, Y.9
Park, J.10
Song, M.11
Kim, K.12
Lim, J.13
Kim, K.14
-
3
-
-
0028572690
-
Cost of silicon viewed from VLSI design perspective
-
Jun
-
W. Maly, "Cost of silicon viewed from VLSI design perspective," in Tech. Dig. 31st Conf. Design Automation, Jun. 1994, pp. 135-142.
-
(1994)
Tech. Dig. 31st Conf. Design Automation
, pp. 135-142
-
-
Maly, W.1
-
5
-
-
0016645729
-
Use of power transformations to model the yield of IC's as a function of active circuit area
-
Dec
-
J. Sredni, "Use of power transformations to model the yield of IC's as a function of active circuit area," in Tech. Dig. Int. Electron Device Meeting, Dec. 1975, pp. 123-125.
-
(1975)
Tech. Dig. Int. Electron Device Meeting
, pp. 123-125
-
-
Sredni, J.1
-
6
-
-
0019530357
-
Determining IC layout rules for cost minimization
-
Feb
-
R. Rung, "Determining IC layout rules for cost minimization," J. Solid- State Circuits, vol. 16, no. 1, pp. 35-43, Feb. 1981.
-
(1981)
J. Solid- State Circuits
, vol.16
, Issue.1
, pp. 35-43
-
-
Rung, R.1
-
7
-
-
0014923116
-
A new look at yield of integrated circuits
-
Aug
-
J. E. Price, "A new look at yield of integrated circuits," Proc. IEEE, vol. 58, no. 12, pp. 1290-1291, Aug. 1970.
-
(1970)
Proc. IEEE
, vol.58
, Issue.12
, pp. 1290-1291
-
-
Price, J.E.1
-
10
-
-
84938162176
-
Cost-Size optima of monolithic integrated cicruits
-
Dec
-
B. T. Murphy, "Cost-Size optima of monolithic integrated cicruits," Proc. IEEE, vol. 52, no. 12, pp. 1537-1545, Dec. 1964.
-
(1964)
Proc. IEEE
, vol.52
, Issue.12
, pp. 1537-1545
-
-
Murphy, B.T.1
-
11
-
-
10744227833
-
512-Mb PROM with a three-dimensional array of diode/ antifuse memory cells
-
Nov
-
M. Johnson, "512-Mb PROM with a three-dimensional array of diode/ antifuse memory cells," IEEE J. Solid-State Circuits, vol. 38, no. 6, pp. 1920-1928, Nov. 2003.
-
(2003)
IEEE J. Solid-State Circuits
, vol.38
, Issue.6
, pp. 1920-1928
-
-
Johnson, M.1
-
12
-
-
67649290200
-
-
R. C. Leachman, Competitive Semiconductor Manufacturing: Final Report From Benchmarking Eight-Inch, Sub-350 nm Wafer Fabrication Lines Univ. California, Berkeley, 2002.
-
R. C. Leachman, Competitive Semiconductor Manufacturing: Final Report From Benchmarking Eight-Inch, Sub-350 nm Wafer Fabrication Lines Univ. California, Berkeley, 2002.
-
-
-
-
13
-
-
0036565013
-
Derivation and implication of a novel DRAM bit cost model
-
May
-
H. Nakatsuka, "Derivation and implication of a novel DRAM bit cost model," IEEE Trans. Semicond. Manuf., vol. 15, no. 2, pp. 279-284, May 2002.
-
(2002)
IEEE Trans. Semicond. Manuf
, vol.15
, Issue.2
, pp. 279-284
-
-
Nakatsuka, H.1
|