Interface characterization of nickel contacts to bulk bismuth tellurium selenide

Surface and Interface Analysis

Volumn 41, Issue 5, 2009, Pages 440-444

  Iyore, O D ^a   Lee, T H ^a   Gupta, R P ^a   White, J B ^b   Alshareef, H N ^a   Kim, M J ^a   Gnade, B E ^a  

^a The University of Texas at Dallas   (United States)

^b Marlow Industries   (United States)

Author keywords

Electron energy loss spectroscopy; Focused ion beam; Thermoelectric materials; Transmission electron microscopy; X ray diffraction

Indexed keywords

AFTER-HEAT TREATMENT; ANALYTICAL ELECTRON MICROSCOPY; BISMUTH TELLURIDE; EXPOSURE TIME; FIB/SEM; INTERFACE CHARACTERIZATION; INTERFACIAL REGION; ION BEAM ENERGY; LIFT-OUT TECHNIQUES; SELECTED AREA DIFFRACTION PATTERNS; SELENIDE; TEM; THERMOELECTRIC MATERIALS;

BISMUTH; DIFFRACTION; DISSOCIATION; ELECTRON EMISSION; ELECTRON ENERGY LEVELS; ELECTRON MICROSCOPES; ELECTRON SCATTERING; ELECTRONS; ENERGY DISSIPATION; FOCUSED ION BEAMS; HOLOGRAPHIC INTERFEROMETRY; IONS; NICKEL; NICKEL ALLOYS; NUCLEAR INSTRUMENTATION; SOLID ELECTROLYTES; TELLURIUM; TELLURIUM COMPOUNDS; THERMOELECTRIC EQUIPMENT; THERMOELECTRICITY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 67649195077     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3046     Document Type: Article

References (10)

1. HJ. Goldsmid, R. W. Douglas, Br.J. Appl. Phys., 1954, 5, 386.
2. H. J. Goldsmid, Electronic Refrigeration, Pion Limited: London, 1986.
3. Y. C. Lan, G. Wang, G. Chen, Z. F. Ren, Appl. Phys. Lett., 2008, 92, 101910.
4. L A. Giannuzzi, F.A. Stevie, Micron 1999, 30, 197.
5. M. H.F. Overwijk, F.C. Van den Heuvel, C. W.T. Bulle-Lieuwma, J. Vac. Sci. Technol., B, 1993, 11, 2021.
6. R. M. Langford, C. Clinton, Micron, 2004, 35, 607.
7. H. White, Y. Pu, M. Rafailovich, J. Sokolov, A. H. King, L. A. Giannuzzi, C. Urbanik-Shannon, B. W. Kempshall, A. Eisenberg, S.A. Schwarz, Y. M. Strzhemeckny, Polymer, 2001, 42, 1613.
8. JJ. Ritter, P. Maruthamuthu, Inorg. Chem., 1997, 36, 260.
9. T. Kacsich, E. Kolawa, J. P. Fleurial, T. Caillat, M. A. Nicolet, J. Phys. D: Appl. Phys., 1998, 31, 2406.
10. A. D. Mah, L. B. Pankratz, in Contributions to the Data on Theoretical Metallurgy: XVI, Thermodynamic Properties of Nickel and its Inorganic Compounds, vol. 668 (Ed.: B. o. M. United States Department of the Interior), United States Department of the Interior, Bureau of Mines: U.S. Government Printing Office, Washington, 1976.