Temperature-induced obliteration of sub-oxide interfaces in amorphous GeO

Journal of Non-Crystalline Solids

Volumn 355, Issue 22-23, 2009, Pages 1285-1287

  Schacht, A ^a,b   Sternemann, C ^a   Hohl, A ^c   Sternemann, H ^a   Sahle, Ch J ^a   Paulus, M ^a   Tolan, M ^a  

^a TU DORTMUND UNIVERSITY   (Germany)

^b Brucker Advanced Supercon GmbH   (Germany)

^c DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Amorphous materials; Germanium; Nanocrystals; X ray scattering

Indexed keywords

AMORPHOUS GERMANIUM; ANNEALING TEMPERATURES; ELEVATED TEMPERATURE; NANOSCALED; OXIDE CONTENTS; OXIDE INTERFACES; PARTIAL FLUORESCENCE YIELDS; TEMPERATURE-INDUCED; TEMPERATURE-INDUCED PHASE SEPARATION;

GERMANIUM; NANOCRYSTALS; PHASE INTERFACES; PHASE SEPARATION; SCATTERING; X RAY SCATTERING;

AMORPHOUS MATERIALS;

EID: 67649085920     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2009.04.040     Document Type: Article

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