A comparative study of Ge nanocrystals in SixGeyOz alloys and SiOx/GeOy multilayers

Journal of Applied Physics

Volumn 81, Issue 5, 1997, Pages 2384-2390

  Zacharias, M ^a   Weigand, R ^a   Dietrich, B ^b   Stolze, F ^a,c   Blasing J ^a   Veit, P ^a   Drusedau T ^a   Christen, J ^a  

^a OTTO VON GUERICKE UNIVERSITY   (Germany)

^b IHP   (Germany)

^c MARIST COLLEGE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012818041     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.364242     Document Type: Review

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