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Volumn 93, Issue 6-7, 2009, Pages 768-773

Degradation modeling of InGaP/GaAs/Ge triple-junction solar cells irradiated with various-energy protons

Author keywords

Carrier removal rate; Damage coefficient; Degradation modeling; Proton irradiation; Triple junction solar cell

Indexed keywords

CARRIER REMOVAL RATE; DAMAGE COEFFICIENT; DEGRADATION MODELING; DEVICE SIMULATORS; ENERGY PROTONS; EXPERIMENTAL VALUES; EXTERNAL QUANTUM EFFICIENCIES; LIFE TIME PREDICTIONS; MINORITY CARRIER DIFFUSION LENGTHS; ONE-DIMENSIONAL; OPEN-CIRCUIT VOLTAGES; SHORT-CIRCUIT CURRENTS; TRIPLE JUNCTIONS; TRIPLE-JUNCTION SOLAR CELL;

EID: 67349280349     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2008.09.044     Document Type: Article
Times cited : (93)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.