Detecting sp2 phase on diamond surfaces by atomic force microscopy phase imaging and its effects on surface conductivity

Diamond and Related Materials

Volumn 18, Issue 5-8, 2009, Pages 722-725

  Kozak, H ^a   Kromka, A ^a   Ukraintsev, E ^a   Houdkova, J ^a   Ledinsky, M ^a   Vanecek M ^a   Rezek, B ^a  

^a INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

AFM; Nanocrystalline diamond; Non diamond phase; Photolithography; Raman spectroscopy; SEM; Surface conductivity; XPS

Indexed keywords

AFM; NANOCRYSTALLINE DIAMOND; NON-DIAMOND PHASE; SEM; SURFACE CONDUCTIVITY; XPS;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; ATOMS; AUGER ELECTRON SPECTROSCOPY; DIAMOND CUTTING TOOLS; DIAMOND FILMS; DIAMONDS; DIELECTRIC PROPERTIES; ELECTRIC CONDUCTIVITY; GRAIN BOUNDARIES; NANOCRYSTALLINE MATERIALS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SPECTRUM ANALYSIS; SURFACE MORPHOLOGY;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 67349224735     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.diamond.2009.02.010     Document Type: Article

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