Electron emission characterization of diamond thin films grown from a solid carbon source

Thin Solid Films

Volumn 280, Issue 1-2, 1996, Pages 256-261

  Jou, Shyankay ^a   Doerr, Hans J ^a   Bunshah, Rointan F ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Diamond; Electrical properties and measurements; Nanostructures; Plasma processing and deposition

Indexed keywords

CARBON; COMPOSITION; DEPOSITION; ELECTRIC PROPERTIES; ELECTRIC VARIABLES MEASUREMENT; ELECTRON EMISSION; FILM GROWTH; MORPHOLOGY; NANOSTRUCTURED MATERIALS; PLASMA APPLICATIONS; THIN FILMS;

BAND MICROSTRUCTURE; CONDUCTING NANOCRYSTALLINE DIAMOND COMPOSITE FILMS; FOWLER-NORDHEIM PLOTS; PLASMA ENHANCED CHEMICAL TRANSPORT; SOLID CARBON SOURCE;

DIAMOND FILMS;

EID: 0030195717     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(96)08756-1     Document Type: Article

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