Aging effect of rolled-up InGaAs/GaAs/Cr helical nanobelts

Microelectronic Engineering

Volumn 86, Issue 4-6, 2009, Pages 824-827

  Zhang, Li ^a   Xu, Didi ^a   Dong, Lixin ^a,b   Nelson, Bradley J ^a  

^a ETH ZURICH   (Switzerland)

^b Michigan State University   (United States)

Author keywords

Aging effect; Helical nanobelts; Self scrolling technique; Stress relaxation

Indexed keywords

AGING EFFECT; FINITE-ELEMENT MODELING; GRADUAL CHANGES; HELICAL NANOBELTS; SELF-SCROLLING TECHNIQUE;

RESIDUAL STRESSES; STRESS RELAXATION;

NANOBELTS;

EID: 67349205579     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2009.01.044     Document Type: Article

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