Auger and photoluminescence analysis of ZnO nanowires grown on AlN thin film

Applied Surface Science

Volumn 255, Issue 15, 2009, Pages 6985-6988

  Yousefi, Ramin ^a   Kamaluddin, Burhanuddin ^a   Ghoranneviss, Mahmood ^b   Hajakbari, Fatemeh ^b  

^a UNIVERSITY OF MALAYA   (Malaysia)

^b ISLAMIC AZAD UNIVERSITY   (Iran)

Author keywords

AlN thin film; Auger spectroscopy; Diffusion; Photoluminescence; ZnO nanowires

Indexed keywords

ALUMINUM NITRIDE; AUGER ELECTRON SPECTROSCOPY; AUGERS; DIFFUSION; II-VI SEMICONDUCTORS; III-V SEMICONDUCTORS; NANOWIRES; PHOTOLUMINESCENCE; PHYSICAL VAPOR DEPOSITION; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION; ZINC OXIDE;

ALN THIN FILMS; AUGER SPECTROSCOPY; CONVENTIONAL TUBES; DEEP LEVEL EMISSION; PHOTOLUMINESCENCE ANALYSIS; ULTRAVIOLET EMISSION; ULTRAVIOLET PEAKS; ZNO NANOWIRES;

NITROGEN COMPOUNDS;

EID: 67349200625     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.03.025     Document Type: Article

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