CdS thin film: Synthesis and characterization

Solid State Sciences

Volumn 11, Issue 7, 2009, Pages 1226-1228

  Hankare, P P ^a   Chate, P A ^b   Sathe, D J ^c  

^a SHIVAJI UNIVERSITY   (India)

^b JSM College   (India)

^c KIT's College of Engineering   (India)

Author keywords

Chemical synthesis; Semiconductor; Thin films; X ray diffraction

Indexed keywords

BAND-GAP VALUES; CDS; CDS THIN FILMS; CHEMICAL SYNTHESIS; COMPLEXING AGENTS; CRYSTALLINITY; CUBIC PHASE; DEPOSITED FILMS; SEMICONDUCTOR; SPECIFIC CONDUCTIVITY; STRUCTURAL CHARACTERIZATION; SUCCINIC ACIDS; SYNTHESIS AND CHARACTERIZATION;

CADMIUM COMPOUNDS; CHARACTERIZATION; DATA STORAGE EQUIPMENT; HOLOGRAPHIC INTERFEROMETRY; SEMICONDUCTING CADMIUM COMPOUNDS; SYNTHESIS (CHEMICAL); THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

DIFFRACTION;

EID: 67349139226     PISSN: 12932558     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solidstatesciences.2009.03.016     Document Type: Article

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