|
Volumn 477, Issue 1-2, 2009, Pages 85-89
|
Structure and ferro/piezoelectric properties of SrBi4Ti4O15 films deposited on TiO2 buffer layer
|
Author keywords
Bismuth layered compounds; Buffer layer; Thin films
|
Indexed keywords
BOTTOM ELECTRODES;
C-AXIS DIRECTIONS;
CHEMICAL SOLUTIONS;
DIELECTRIC AND FERROELECTRIC PROPERTIES;
ELECTRICAL PROPERTIES;
INTEGRATED DEVICES;
RANDOM ORIENTATIONS;
SI SUBSTRATES;
SINGLE PHASE;
X- RAY DIFFRACTIONS;
BISMUTH;
BISMUTH COMPOUNDS;
BUFFER LAYERS;
ELECTRIC PROPERTIES;
FERROELECTRICITY;
OXIDE MINERALS;
PEROVSKITE;
PLATINUM;
THIN FILM DEVICES;
THIN FILMS;
SEMICONDUCTING SILICON COMPOUNDS;
|
EID: 67349121779
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2008.10.138 Document Type: Article |
Times cited : (8)
|
References (16)
|