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X-Ray Spectrometry

Volumn 38, Issue 3, 2009, Pages 239-243

Chemical speciation of sulfur in activated carbon by wavelength-dispersive PIXE technique

(5) Tada, T a Fukuda, H a Hasegawa, J a Oguria, Y a Tsuji, M b

a Tokyo Institute of Technology ^* (Japan)

b E and e Solutions Inc (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 67249088978 PISSN: 00498246 EISSN: 10974539 Source Type: Journal
DOI: 10.1002/xrs.1147 Document Type: Article

Times cited : (6)

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