Chemical state analysis of sulfur in samples of environmental interest using high resolution measurement of Kα diagram line

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 222, Issue 3-4, 2004, Pages 601-608

  Kavčič, Matjaž ^a   Karydas, A G ^b   Zarkadas, Ch ^b  

^a JO EF STEFAN INSTITUTE   (Slovenia)

^b INSTITUTE OF NANOSCIENCE AND NANOTECHNOLOGY   (Greece)

Author keywords

Chemical state analysis; Proton induced X ray spectra; Wavelength dispersive spectrometer

Indexed keywords

AEROSOLS; CHARGED PARTICLES; GRAPH THEORY; OPTICAL RESOLVING POWER; WAVELENGTH DISPERSIVE SPECTROSCOPY; X RAY SPECTROSCOPY;

CHEMICAL STATE ANALYSIS; CRYSTAL SPECTROMETER; MOLECULAR ORBITAL; PROTON INDUCED X-RAY SPECTRA;

SULFUR;

EID: 19244370380     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2004.04.161     Document Type: Article

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