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Volumn 39, Issue 2, 2008, Pages 88-94

WDS versus silicon drift detector EDS: A case report for the comparison of quantitative chemical analyses of natural silicate minerals

Author keywords

Chemistry; EDS; Mineral analyses; WDS

Indexed keywords

ELECTRON BEAMS; ELECTRON PROBE MICROANALYSIS; SILICATE MINERALS; SPECTRAL RESOLUTION; TRACE ELEMENTS; X RAY SPECTROMETERS;

EID: 39449137916     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2006.11.004     Document Type: Review
Times cited : (29)

References (10)
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    • Accuracy, precision and detection limits of energy-dispersive electron-microprobe analyses of silicates
    • Dunham A.C., and Wilkinson F.C.F. Accuracy, precision and detection limits of energy-dispersive electron-microprobe analyses of silicates. X-ray Spectrom. 7 2 (1978) 50-56
    • (1978) X-ray Spectrom. , vol.7 , Issue.2 , pp. 50-56
    • Dunham, A.C.1    Wilkinson, F.C.F.2
  • 4
    • 15844393071 scopus 로고    scopus 로고
    • Review of semiconductor drift detectors
    • Gatti E., and Rehak P. Review of semiconductor drift detectors. Nucl. Instr. Meth. A 541 (2005) 47-60
    • (2005) Nucl. Instr. Meth. A , vol.541 , pp. 47-60
    • Gatti, E.1    Rehak, P.2
  • 5
    • 0030796580 scopus 로고    scopus 로고
    • Nomenclature of amphiboles: report of the subcommittee on amphiboles of the International Commission on New Minerals and Mineral Names
    • Leake B.E., Woolley A.R., Arps C.E.S., Birch W.D., Gilbert M.C., Grice J.D., et al. Nomenclature of amphiboles: report of the subcommittee on amphiboles of the International Commission on New Minerals and Mineral Names. Miner. Mag. 61 (1997) 295-321
    • (1997) Miner. Mag. , vol.61 , pp. 295-321
    • Leake, B.E.1    Woolley, A.R.2    Arps, C.E.S.3    Birch, W.D.4    Gilbert, M.C.5    Grice, J.D.6
  • 7
    • 0036874065 scopus 로고    scopus 로고
    • Barriers to quantitative electron probe X-ray microanalysis for low voltage scanning electron microscopy
    • Newbury E.D. Barriers to quantitative electron probe X-ray microanalysis for low voltage scanning electron microscopy. J. Res. Natl. Inst. Std. Technol. 107 (2002) 605-619
    • (2002) J. Res. Natl. Inst. Std. Technol. , vol.107 , pp. 605-619
    • Newbury, E.D.1
  • 8
    • 0012729590 scopus 로고
    • Quantitative electron microprobe analysis using a lithium drifted silicon detector
    • Reed S.J.B., and Ware N.G. Quantitative electron microprobe analysis using a lithium drifted silicon detector. X-ray Spectrom. 2 (1973) 69-74
    • (1973) X-ray Spectrom. , vol.2 , pp. 69-74
    • Reed, S.J.B.1    Ware, N.G.2
  • 9
    • 5444237396 scopus 로고    scopus 로고
    • Analytical advances in the SEM
    • Scott J.H.J. Analytical advances in the SEM. Anal. Bioanal. Chem. 375 (2003) 38-40
    • (2003) Anal. Bioanal. Chem. , vol.375 , pp. 38-40
    • Scott, J.H.J.1
  • 10
    • 0036874047 scopus 로고    scopus 로고
    • Limitations to accuracy in extracting characteristic line intensities from X-ray spectra
    • Statham P.J. Limitations to accuracy in extracting characteristic line intensities from X-ray spectra. J. Res. Natl. Inst. Std. Technol. 107 (2002) 531-546
    • (2002) J. Res. Natl. Inst. Std. Technol. , vol.107 , pp. 531-546
    • Statham, P.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.