Developing DRC plus rules through 2D pattern extraction and clustering techniques

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7275, Issue , 2009, Pages

  Dai, Vito ^a   Capodieci, Luigi ^a   Yang, Jie ^a   Rodriguez, Norma ^a  

^a ADVANCED MICRO DEVICES   (United States)

Author keywords

Classify; Design; Hotspot; Manufacturability; Pattern; Rule; Style; Variability

Indexed keywords

CLASSIFY; HOTSPOT; MANUFACTURABILITY; PATTERN; RULE; STYLE; VARIABILITY;

MACHINE DESIGN; PATTERN MATCHING; SECURITY OF DATA; VISUAL COMMUNICATION;

STANDARDS;

EID: 66749128679     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.814347     Document Type: Conference Paper

References (10)

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