Polarity effect near the surface and interface of thin supported polymer films: X-ray reflectivity study

Langmuir

Volumn 25, Issue 10, 2009, Pages 5667-5673

  Ann, Sungii ^a   Kim, Jung Hoon ^a   Kim, Jae Hyun ^b   Jung, Jin Chul ^a   Chang, Taihyun ^a   Ree, Moonhor ^a   Zin, Wang Cheol ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

^b SAMSUNG Electronics   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

BEAM PROFILES; CHEMICAL STRUCTURE; DATA CORRECTIONS; DENSITY PROFILE; DISTORTED WAVE BORN APPROXIMATION; ELECTRON DENSITY PROFILES; FITTING METHOD; FITTING TECHNIQUES; HOMOPOLYMER; MOLE FRACTION; PENDANT GROUPS; POLARITY EFFECT; POLY(4-VINYLPYRIDINE) (P4VP); RANDOM COPOLYMER; REPRODUCIBILITY; SI OXIDE; SI WAFER; SURFACE AND INTERFACES; SURFACES AND INTERFACES; X RAY REFLECTIVITY;

APPROXIMATION THEORY; BORN APPROXIMATION; CARRIER CONCENTRATION; ELECTRON DENSITY MEASUREMENT; ELECTRONS; ESTERS; OXIDE FILMS; PLASTIC FILMS; POLYMERS; POLYSTYRENES; REFLECTION; SEMICONDUCTING SILICON COMPOUNDS; SILICON; SILICON WAFERS; STYRENE; X RAY DIFFRACTION;

POLYMER FILMS;

EID: 66249100550     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la804260t     Document Type: Article

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