Effect of thickness on the dielectric property and nonlinear current-voltage behavior of CaCu3Ti4O12 thin films

Physics Letters, Section A: General, Atomic and Solid State Physics

Volumn 373, Issue 27-28, 2009, Pages 2389-2392

  Li, Y W ^a   Shen, Y D ^a   Hu, Z G ^a   Yue, F Y ^a   Chu, J H ^a,b  

^a EAST CHINA NORMAL UNIVERSITY   (China)

^b SHANGHAI INSTITUTE OF TECHNICAL PHYSICS   (China)

Author keywords

Dielectrics; Electrical properties; Sol gel

Indexed keywords

CALCIUM COMPOUNDS; COPPER COMPOUNDS; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES OF SOLIDS; ELECTRIC PROPERTIES; GRAIN BOUNDARIES; SOL-GEL PROCESS; SOL-GELS; TITANIUM COMPOUNDS;

BULK CONDUCTIVITIES; CONDUCTIVE PROCESS; DIFFERENT THICKNESS; ELECTRODE INTERFACE; INTERFACIAL LAYER; NONLINEAR CURRENT; POOLE-FRENKEL EMISSION; PROCESS TRANSFERS;

THIN FILMS;

EID: 65749116014     PISSN: 03759601     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physleta.2009.05.001     Document Type: Article

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