Electric and dielectric properties of pure and doped CaCu 3Ti4O12 perovskite materials

Solid State Communications

Volumn 132, Issue 3-4, 2004, Pages 241-246

  Chiodelli, G ^a   Massarotti, V ^a,b   Capsoni, D ^a,b   Bini, M ^b   Azzoni, C B ^c   Mozzati, M C ^c   Lupotto, P ^d  

^a CNR   (Italy)

^b UNIVERSITY OF PAVIA   (Italy)

^c INFM   (Italy)

^d Amel Electrochemistry   (Italy)

Author keywords

A. Semiconductors; C. Grain boundaries; D. Dielectric response; E. Impedance spectroscopy

Indexed keywords

CAPACITANCE; DIELECTRIC PROPERTIES; DOPING (ADDITIVES); ELECTRIC CONDUCTANCE; GRAIN BOUNDARIES; PERMITTIVITY; PEROVSKITE; RAMAN SCATTERING; SINTERING; THIN FILMS;

DIELECTRIC RESPONSE; DIRECT CURRENT MEASUREMENTS; IMPEDANCE SPECTROSCOPY (IS); INTEGRATED RESONANT ELEMENTS;

CALCIUM ALLOYS;

EID: 4444349862     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2004.07.058     Document Type: Article

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