Using the in situ lift-out technique to prepare TEM specimens on a single-beam FIB instrument

Journal of Physics: Conference Series

Volumn 126, Issue , 2008, Pages

  Lekstrom, M ^a   McLachlan, M A ^a   Husain, S ^a   McComb, D W ^a   Shollock, B A ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 65649132285     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/126/1/012028     Document Type: Article

References (7)

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6. Volkert C A and Minor A M 2007 MRS Bul 32 389-99
7. Prenitzer B I, Urbanik-Shannon C A, Giannuzzi L A, Brown S R, Irwin R B, Shofner T L and Stevie F A 2003 Microsc. Microanal 9 216-36