Passivation of pinhole defect microelectrode arrays in ultrathin silica films immobilized on gold substrates

Thin Solid Films

Volumn 517, Issue 18, 2009, Pages 5399-5403

  Macech, Piotr ^a   Pemberton, Jeanne E ^a  

^a University of Arizona   (United States)

Author keywords

Atomic force microscopy; Electropolymerization; Fourier transform infrared spectroscopy; Insulating overlayer; Microelectrode array; Pinhole defect; Poly(phenylene) oxide; Silica

Indexed keywords

ABSORBANCE SPECTROSCOPY; ELECTROCHEMICAL POLYMERIZATION; GOLD OXIDE; GOLD SUBSTRATES; INFRARED REFLECTANCE; INSULATING OVERLAYER; MICROELECTRODE ARRAY; PINHOLE DEFECT; PINHOLE DEFECTS; POLY(PHENYLENE); RANDOM ARRAY; SILICA FILM; ULTRA MICROELECTRODES; ULTRA-THIN; VOLTAMMETRIC CYCLES; VOLTAMMETRIC RESPONSE;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; ATOMS; ELECTROPOLYMERIZATION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GOLD; MICROELECTRODES; OXIDE FILMS; PASSIVATION; PHENOLIC RESINS; PHENOLS; SILICA; SPECTROSCOPIC ANALYSIS; SPECTRUM ANALYSIS; SURFACE DEFECTS; ULTRATHIN FILMS;

FOURIER TRANSFORMS;

EID: 65649090231     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.01.057     Document Type: Article

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