Hard disk magnetic domain nano-spatial resolution imaging by using a near-field scanning microwave microscope with an AFM probe tip

Journal of Magnetism and Magnetic Materials

Volumn 321, Issue 16, 2009, Pages 2483-2487

  Melikyan, Harutyun ^a   Sargsyan, Tigran ^a   Babajanyan, Arsen ^a   Kim, Seungwan ^a   Kim, Jongchel ^a   Lee, Kiejin ^a   Friedman, Barry ^b  

^a Sogang University   (South Korea)

^b SAM HOUSTON STATE UNIVERSITY   (United States)

Author keywords

AFM tip; Hard disk; Magnetic domain; Microwave; Near field; Permeability

Indexed keywords

AFM PROBES; AFM TIP; ATOMIC FORCE MICROSCOPES; DIRECT IMAGING; DISTANCE CONTROLS; EXTERNAL MAGNETIC FIELDS; HARD DISK; HIGH SENSITIVITIES; MAGNETIC FORCE MICROSCOPES; NANO-SCALE; NEAR-FIELD; NEAR-FIELD SCANNING MICROWAVE MICROSCOPES; OPERATING FREQUENCIES; PERMEABILITY; PROBE TIPS; QUANTITATIVE MEASUREMENTS; REFLECTION COEFFICIENTS; SPATIAL RESOLUTIONS; TUNING FORKS;

ATOMIC FORCE MICROSCOPY; CAPILLARITY; IMAGE RESOLUTION; MAGNETIC FIELDS; MAGNETIC MATERIALS; MICROSCOPES; MICROWAVES; PROBES; SCANNING;

MAGNETIC DOMAINS;

EID: 65549171456     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2009.03.068     Document Type: Article

References (20)

1. Lai K., Ji M., Leindecker N., Kelly M., and Shen Z. Rev. Sci. Instrum. 78 (2007) 063702
2. Sandhu A., Masuda H., Oral A., and Bending S. Jpn. J. Appl. Phys. 40 (2001) 4321
3. Saenz J., Garcia N., Grutter P., Mayer E., Heinxelmann H., Wiesendanger R., Rosenthaler L., Hidber H., and Guntherodt H. J. Appl. Phys. 62 (1987) 4293
4. Kryder M., and Gustafson R. J. Magn. Magn. Mater. 287 (2005) 449
5. Black R., Wellstood F., Dantsker E., Miklich A., Nemeth D., Koelle D., Ludwig F., and Clarke J. Appl. Phys. Lett. 66 (1995) 99
6. Fidler J., Schrefl T., Scholz W., Suess D., Dittrich R., and Kirschner M. J. Magn. Magn. Mater. 272 (2004) 641
7. Jung H., Velu E., Malhotra S., Jiang W., and Bertero G. J. Appl. Phys. 99 (2006) 08E702
8. Ogrin F., Lee S., and Oates C. J. Magn. Magn. Mater. 272 (2004) e501
9. Imtiaz A., Anlage S., Barry J., and Melngailis J. Appl. Phys. Lett. 90 (2007) 143106
10. Abu-Teir M., Golosovsky M., Davidov D., Frenkel A., and Goldberger H. Rev. Sci. Instrum. 72 (2001) 2073
11. Babajanyan A., Lee K., Lim E., Manaka T., Iwamoto M., and Friedman B. Appl. Phys. Lett. 90 (2007) 182104
12. Park M., Yoo H., Yoo H., Na S., Kim S., Lee K., Friedman B., Lim E., and Iwamoto M. Thin Solid Films 499 (2006) 318
13. Kim J., Kim M., Lee K., Lee J., Cha D., and Friedman B. Meas. Sci. Technol. 14 (2003) 7
14. Tabib-Azar M., and Wang Y. IEEE Trans. Microwave Theory Tech. 52 (2004) 971
15. Kalinin S., and Gruverman A. Scanning Probe Microscopy-Electrical and Electromechanical Phenomena at the Nanoscale (2007), Springer, New York p. 215
16. Pozar D. Microwave Engineering (1990), Addison-Wesley, New York p. 65
17. Abarra E., Glijer P., Kisker H., Okarnoto I., and Suzuki T. J. Magn. Magn. Mater. 175 (1997) 148
18. Bottoni G., and Candolfo D. J. Magn. Magn. Mater. 316 (2007) e149
19. Sin K., Glijer P., Sivertsen J., and Judy J. J. Magn. Magn. Mater. 155 (1996) 209
20. Friedman B., Gaspar M., Kalachikov S., Lee K., Levisky R., Shen G., and Yoo H. J. Am. Chem. Soc. 127 (2005) 9666