Sensitive, label-free DNA diagnostics based on near-field microwave imaging

Journal of the American Chemical Society

Volumn 127, Issue 27, 2005, Pages 9666-9667

  Friedman, Barry ^a   Gaspar, Mariafrancis A ^b   Kalachikov, Sergey ^c   Lee, Kiejin ^d   Levicky, Rastislav ^b   Shen, Gang ^b   Yoo, Hyunjun ^d  

^a SAM HOUSTON STATE UNIVERSITY   (United States)

^b Columbia University ^*  (United States)

^c Sogang University ^*  (United States)

^d Sogang University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

DNA;

ARTICLE; DIAGNOSTIC IMAGING; DIAGNOSTIC PROCEDURE; FLUORESCENCE; MICROWAVE IRRADIATION; OSCILLATION; SENSITIVITY AND SPECIFICITY; SURFACE PROPERTY; X RAY PHOTOELECTRON SPECTROSCOPY;

DNA; MICROWAVES;

EID: 22144449594     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja051760i     Document Type: Article

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