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Volumn 20, Issue 19, 2009, Pages
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Atomic layer deposition of quantum-confined ZnO nanostructures
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Author keywords
[No Author keywords available]
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Indexed keywords
ABSORBANCE;
ATOMIC-LAYER DEPOSITIONS;
BAND GAPS;
BLUE-SHIFTED;
CENTRAL COMPOSITE DESIGNS;
COATING THICKNESS;
DIETHYLZINC;
FREE FILMS;
NANO-SIZED;
OPTO-ELECTRONIC PROPERTIES;
POLYCRYSTALLINE ZNO;
POST-DEPOSITION ANNEALING;
POST-TREATMENTS;
POWDER X-RAY DIFFRACTIONS;
SI WAFERS;
THERMAL-ANNEALING;
THREE-DIMENSIONAL SUBSTRATES;
THREE-DIMENSIONAL SURFACES;
ZNO;
ZNO FILMS;
ZNO NANOSTRUCTURES;
ATOMIC LAYER DEPOSITION;
ATOMS;
ENERGY GAP;
HYDROGEN;
HYDROGEN PEROXIDE;
METALLIC FILMS;
QUANTUM CONFINEMENT;
SEMICONDUCTING SILICON COMPOUNDS;
SEMICONDUCTING ZINC COMPOUNDS;
SILICON COMPOUNDS;
SILICON WAFERS;
SPECTROSCOPIC ELLIPSOMETRY;
THICKNESS MEASUREMENT;
THREE DIMENSIONAL;
ZINC OXIDE;
CRYSTALLITE SIZE;
DIETHYLZINC;
HYDROGEN PEROXIDE;
NANOMATERIAL;
SILICON;
SILICON DIOXIDE;
ZINC OXIDE;
ARTICLE;
COMPOSITE MATERIAL;
ELLIPSOMETRY;
FILM;
PARTICLE SIZE;
PRIORITY JOURNAL;
QUANTUM CHEMISTRY;
SCANNING TRANSMISSION ELECTRON MICROSCOPY;
TEMPERATURE MEASUREMENT;
X RAY DIFFRACTION;
CHEMISTRY;
CONFORMATION;
CRYSTALLIZATION;
MACROMOLECULE;
MATERIALS TESTING;
METHODOLOGY;
NANOTECHNOLOGY;
SURFACE PROPERTY;
ULTRASTRUCTURE;
CRYSTALLIZATION;
MACROMOLECULAR SUBSTANCES;
MATERIALS TESTING;
MOLECULAR CONFORMATION;
NANOSTRUCTURES;
NANOTECHNOLOGY;
PARTICLE SIZE;
SURFACE PROPERTIES;
ZINC OXIDE;
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EID: 65549161982
PISSN: 09574484
EISSN: 13616528
Source Type: Journal
DOI: 10.1088/0957-4484/20/19/195401 Document Type: Article |
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Times cited : (27)
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References (24)
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