Quantum oscillations in surface properties

Surface Science

Volumn 603, Issue 10-12, 2009, Pages 1389-1396

  Vazquez de Parga A L ^a,b   Hinarejos, J J ^b   Calleja, F ^b   Camarero, J ^a,b   Otero, R ^a,b   Miranda, R ^a,b  

^a INSTITUTO MADRILEÑO DE ESTUDIOS AVANZADOS EN NANOCIENCIA IMDEA NANOCIENCIA   (Spain)

^b UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

Metallic films; Quantum size effects; Scanning tunneling microscopy; Scanning tunneling spectroscopy

Indexed keywords

BULK PROPERTIES; DIFFERENT SUBSTRATES; DIFFUSIVITIES; METAL OVERLAYERS; METALLIC THIN FILMS; NANO-SCALE; QUANTUM DEVICES; QUANTUM OSCILLATIONS; QUANTUM SIZE EFFECTS; SCANNING TUNNELING SPECTROSCOPY; SEMICONDUCTING SUBSTRATES; SURFACE-ROUGHENING; THERMAL STABILITIES;

CHEMICAL REACTIVITY; CHEMICAL STABILITY; EPITAXIAL GROWTH; LEAD; METALLIC FILMS; SCANNING; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING FILMS; SEMICONDUCTOR GROWTH; SIZE DETERMINATION; SPECTRUM ANALYSIS; SUBSTRATES; SUPERCONDUCTING FILMS; SUPERCONDUCTING TRANSITION TEMPERATURE; SURFACE PROPERTIES; TRACE ANALYSIS;

EPITAXIAL FILMS;

EID: 65549100648     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2008.08.039     Document Type: Article

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