Quantized hall effect in ultrathin metallic films

Physical Review Letters

Volumn 76, Issue 22, 1996, Pages 4227-4229

  Jalochowski M ^a   Hoffman, M ^b   Bauer, E ^b  

^a MARIA CURIE SK ODOWSKA UNIVERSITY   (Poland)

^b CLAUSTHAL UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0344437965     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.76.4227     Document Type: Article

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