"torsional tapping" atomic force microscopy using T-shaped cantilevers

Applied Physics Letters

Volumn 94, Issue 17, 2009, Pages

  Mullin, Nic ^a   Vasilev, Cvetelin ^a   Tucker, Jaimey D ^a   Hunter, C Neil ^a   Weber, Christa H M ^a   Hobbs, Jamie K ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPE CANTILEVERS; ERROR SIGNALS; HIGH RESOLUTION IMAGES; MEMBRANE PROTEINS; OPTICAL LEVERS; QUALITY FACTORS; RESONANT FREQUENCIES; TIP-SAMPLE FORCES; TORSIONAL OSCILLATIONS;

ATOMS; NATURAL FREQUENCIES;

NANOCANTILEVERS;

EID: 65449175709     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3126047     Document Type: Article

References (20)

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