Effect of annealing temperature on the optical and electrical properties of aluminum doped ZnO films

Journal of Non-Crystalline Solids

Volumn 355, Issue 14-15, 2009, Pages 840-843

  Shelke, Vrushali ^a   Sonawane, B K ^a   Bhole, M P ^a   Patil, D S ^a  

^a NORTH MAHARASHTRA UNIVERSITY   (India)

Author keywords

Conductivity; FTIR measurements; II VI semiconductors; Indium tin oxide and other transparent conductors; Optical spectroscopy; Spin coating

Indexed keywords

CONDUCTIVITY; FTIR MEASUREMENTS; II-VI SEMICONDUCTORS; INDIUM TIN OXIDE AND OTHER TRANSPARENT CONDUCTORS; OPTICAL SPECTROSCOPY;

ALUMINA; ALUMINUM; ANNEALING; CRYSTALS; ELECTRIC CONDUCTIVITY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INDIUM; LIGHT REFRACTION; LITHIUM COMPOUNDS; METALLIC FILMS; PHOTOLITHOGRAPHY; REFRACTIVE INDEX; REFRACTOMETERS; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTING ZINC COMPOUNDS; SPECTROSCOPIC ANALYSIS; SPIN DYNAMICS; THERMAL EFFECTS; TIN; TITANIUM COMPOUNDS; ZINC OXIDE;

OPTICAL CONDUCTIVITY;

EID: 65449171095     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2009.04.018     Document Type: Article

References (16)

1. Dong X., Zhu H.C., Zhang B.L., Li X.P., and Du G.T.T. Semicond. Sci. Technol. 22 (2007) 1111
2. Pei Z.L., Sun C., Tan M.H., Xiao J.Q., Guan D.H., Huang R.F., and Wen L.S. J. Appl. Phys. 90 (2001) 3432
3. Lewis B.G. Paine DC MRS Bull. 25 (2000) 22
4. Elvira F., Alexandra G., Vitor A., Antonio M., Hugo A., Lui{dotless}s P., Isabel F., and Rodrigo M. Thin Solid Films 442 (2003) 121
5. Bhole M.P., and Patil D.S. J. Phys. Chem. Solids 70 (2009) 466
6. Bhole M.P., and Patil D.S. Mod. Phys. Lett. B. 22 (2008) 685
7. Bhole M.P., Samuel E.P., and Patil D.S. Int. J. Mod. Phys. B 22 (2008) 1985
8. Kim H., Horwitz J.S., Qadri S.B., and Chrisey D.B. Thin Solid Films 107 (2002) 420
9. Shelake V., Bhole M.P., and Patil D.S. Opt. Adv. Mater-RC 2 6 (2008) 353
10. Kim H., and Gilmore C.M. Appl. Phys. Lett. 76 (2000) 259
11. Choopun S., Vispute R.D., Yang W., Sharma R.P., Venkatesan T., and Shen H. Appl. Phys. Lett. 80 9 (2002) 1529
12. Makino T., Segawa Y., Kawasaki M., Ohtoma A., Shiraki R., Tamura K., Yasuda T., and Koinuma H. Appl. Phys. Lett. 78 9 (2001) 1237
13. Krc J., Zeman M., Kluth O., Smole F., and Topic M. Thin Solid Films 426 (2003) 296
14. Water W., and Chu S.-Y. Mater. Lett. 55 (2002) 67
15. Ko H.-J., Yao T., Chen Y., and Hong S.-K. J. Appl. Phys. 92 (2002) 4354
16. Zhao D., Liu Y., Shen D., Lu Y., Zhang J., and Fan X. J. Appl. Phys. 90 11 (2001) 5561