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Volumn 70, Issue 2, 2009, Pages 466-471
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Effect of annealing temperature on the optical constants of zinc oxide films
a
a
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Author keywords
A. Optical materials; B. Sol gel growth; C. X ray diffraction; D. Optical properties
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Indexed keywords
ANNEALING;
COLLOIDS;
DIFFRACTION;
ELECTRODEPOSITION;
GELATION;
GELS;
GLASS;
GRAIN GROWTH;
GROWTH (MATERIALS);
LIGHT REFRACTION;
MATERIALS PROPERTIES;
METALLIC FILMS;
METEOROLOGICAL INSTRUMENTS;
OPTICAL CONSTANTS;
OPTICAL MATERIALS;
OPTICAL PROPERTIES;
ORGANIC POLYMERS;
OXIDE FILMS;
OXIDES;
REFRACTIVE INDEX;
REFRACTOMETERS;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING ZINC COMPOUNDS;
SOL-GEL PROCESS;
SOL-GELS;
SOLS;
SPECTROPHOTOMETERS;
SPECTROPHOTOMETRY;
SUBSTRATES;
X RAY ANALYSIS;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
ZINC;
ZINC OXIDE;
A. OPTICAL MATERIALS;
ANNEALING TEMPERATURES;
B. SOL-GEL GROWTH;
C. X-RAY DIFFRACTION;
D. OPTICAL PROPERTIES;
ENVELOPE METHODS;
EXTINCTION CO-EFFICIENT;
GLASS SUBSTRATES;
INDEX VALUES;
OPTICAL ENERGY-GAPS;
POLY-CRYSTALLINE;
SCANNING ELECTRONS;
SEM;
SOL-GEL METHODS;
TRANSMITTANCE SPECTRUM;
X-RAY DIFFRACTOMETERS;
XRD SPECTRUM;
ZINC OXIDE FILMS;
ZNO;
ZNO FILMS;
OPTICAL FILMS;
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EID: 59049088567
PISSN: 00223697
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jpcs.2008.12.001 Document Type: Article |
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Times cited : (38)
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References (23)
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