Characterization of heterogeneities in detector-grade cdznte crystals

Journal of Materials Research

Volumn 24, Issue 4, 2009, Pages 1361-1367

  Duff, M C ^a   Hunter, D B ^a   Burger, A ^b   Groza, M ^b   Buliga, V ^b   Bradley, J P ^c   Graham, G ^c   Dai, Z R ^c   Teslich, N ^c   Black, D R ^d   Lanzirotti, A ^e  

^a SAVANNAH RIVER NATIONAL LABORATORY   (United States)

^b FISK UNIVERSITY   (United States)

^c LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^d NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^e BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL TECHNIQUES; CDZNTE CRYSTALS; CHARGE COLLECTION EFFICIENCIES; FABRICATED DEVICES; POLY-CRYSTALLINE; ROOM TEMPERATURES; SECONDARY PHASIS;

AMORPHOUS MATERIALS; AMORPHOUS SILICON; CRYSTALS; Z TRANSFORMS; ZINC;

TELLURIUM COMPOUNDS;

EID: 65349138983     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2009.0165     Document Type: Article

References (22)

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