Correlation between bulk material defects and spectroscopic response in cadmium zinc telluride detectors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3768, Issue , 1999, Pages 129-137

  Parker, B H ^a   Stahle, C M ^a   Barthelmy, S D ^a   Parsons, A M ^a   Tueller, J ^a   Van Sant, J T ^a   Munoz, B F ^a   Snodgrass, S J ^a   Mullinix, R E ^a  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; INFRARED IMAGING; NONDESTRUCTIVE EXAMINATION; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTOR DEVICES; SPECTRUM ANALYSIS;

CADMIUM ZINC TELLURIDE; INFRARED TRANSMISSION IMAGING; SEMICONDUCTOR DETECTORS; X RAY SPECTRAL MAPPING;

RADIATION DETECTORS;

EID: 0033328345     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.366576     Document Type: Conference Paper

References (10)