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Volumn 36, Issue 8, 2007, Pages 1092-1097

Synchrotron X-ray based characterization of CdZnTe crystals

Author keywords

IR imaging; Radiation detectors; Semiconductors

Indexed keywords

MORPHOLOGICAL HETEROGENEITIES; STRUCTURAL LEVELS;

EID: 34548259438     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-007-0181-x     Document Type: Conference Paper
Times cited : (10)

References (19)
  • 15
    • 0004033098 scopus 로고
    • 2 Wiley Interscience Publishers New York
    • R.W.G. Wyckoff, Crystal Structures 1, 2nd ed, Wiley Interscience Publishers, NY, 1963.
    • (1963) Crystal Structures 1
    • Wyckoff, R.W.G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.