SCOPUS 정보 검색 플랫폼

Applied Surface Science

Volumn 254, Issue 9, 2008, Pages 2889-2892

Effect of surface preparation technique on the radiation detector performance of CdZnTe

(6) Duff, M C a Hunter, D B a Burger, A b Groza, M b Buliga, V b Black, D R c

a SAVANNAH RIVER NATIONAL LABORATORY (United States)

b FISK UNIVERSITY (United States)

c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

Author keywords

Radiation detectors; Resistivity; X ray topographic imaging; X ray topography (crystal defects)

Indexed keywords

CRYSTAL DEFECTS; ELECTRIC CONDUCTIVITY; ELECTRIC CONTACTS; ETCHING; GAMMA RAYS; GOLD; RADIATION DETECTORS; SEMICONDUCTING CADMIUM COMPOUNDS; TOPOGRAPHY;

CHEMICAL ETCHING; SURFACE PREPARATION; X RAY TOPOGRAPHIC IMAGING; X RAY TOPOGRAPHY;

CRYSTALS;

EID: 39149143977 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/j.apsusc.2007.10.064 Document Type: Article

Times cited : (83)

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