The structure and optical properties of ZnO nanocrystals embedded in SiO2 fabricated by radio-frequency sputtering

Nanotechnology

Volumn 20, Issue 7, 2009, Pages

  Mayer, G ^a   Fonin, M ^a   Rudiger U ^a   Schneider, R ^b   Gerthsen, D ^b   Janen, N ^a   Bratschitsch, R ^a  

^a UNIVERSITY OF KONSTANZ   (Germany)

^b UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL SEPARATIONS; DISTRIBUTION ANALYSIS; ELECTRON MICROSCOPY ANALYSIS; ENERGY-FILTERED TRANSMISSION ELECTRON MICROSCOPIES; EX-SITU; FABRICATION TECHNIQUES; HEXAGONAL CLOSE PACKED; HIGH-CRYSTALLINE QUALITIES; IN-SITU ANNEALING; LATTICE PARAMETERS; MATRIXES; MEAN-GRAIN SIZES; NON-UNIFORM DISTRIBUTIONS; OPTICAL CAVITIES; OPTICAL TRANSMITTANCES; RADIO-FREQUENCY MAGNETRON SPUTTERING; RADIO-FREQUENCY SPUTTERING; SI(1 0 0 ); SMALL PARTICLES; TRILAYER; UNIFORM DISPERSIONS; WURTZITE STRUCTURES; ZNO; ZNO NANOCRYSTALS;

CRYSTALLINE MATERIALS; ELECTRON MICROSCOPES; FABRICATION; NANOCRYSTALS; OPTICAL MICROSCOPY; OPTICAL PROPERTIES; PARTICLE SIZE ANALYSIS; SEMICONDUCTING ZINC COMPOUNDS; SILICON COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; ZINC; ZINC OXIDE; ZINC SULFIDE;

INTEGRATED OPTOELECTRONICS;

ALUMINUM OXIDE; NANOCRYSTAL; SILICON; SILICON DIOXIDE; ZINC OXIDE;

ARTICLE; CHEMICAL STRUCTURE; CRYSTAL; DISPERSION; ELECTRON MICROSCOPY; ENERGY FILTERED TRANSMISSION ELECTRON MICROSCOPY; GRAIN; MICROWAVE OVEN; PARAMETER; PARTICLE SIZE; PRIORITY JOURNAL; RADIOFREQUENCY;

EID: 65349084948     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/7/075601     Document Type: Article

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