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Volumn 53, Issue 1-2, 2008, Pages 223-230
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Investigation of nanocrystals using TEM micrographs and electron diffraction technique
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Author keywords
BF TEM; CVD; Nano sized lognormal; Polycrystalline; SAED; Scherrer
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Indexed keywords
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EID: 42249092848
PISSN: 1221146X
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (25)
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References (8)
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