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Volumn 53, Issue 1-2, 2008, Pages 223-230

Investigation of nanocrystals using TEM micrographs and electron diffraction technique

Author keywords

BF TEM; CVD; Nano sized lognormal; Polycrystalline; SAED; Scherrer

Indexed keywords


EID: 42249092848     PISSN: 1221146X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (25)

References (8)
  • 4
    • 84876958367 scopus 로고    scopus 로고
    • NIST/SEMATECH e-Handbook of Statistical Methods, http://wwwitl.nist.gov/ div898/handbook/, date.
    • NIST/SEMATECH e-Handbook of Statistical Methods, http://wwwitl.nist.gov/ div898/handbook/, date.
  • 7
    • 0037149545 scopus 로고    scopus 로고
    • Finite-size effects in fine particles: Magnetic and transport properties
    • X. Battle, A. Labarta, Finite-size effects in fine particles: magnetic and transport properties, J. Phys. D, Appl. Phys., 2002, 35, R15.
    • (2002) J. Phys. D, Appl. Phys , vol.35
    • Battle, X.1    Labarta, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.