Controlled growth and positioning of metal nanoparticles via scanning probe microscopy

Langmuir

Volumn 25, Issue 6, 2009, Pages 3356-3358

  Silva Pinto, Elisangela ^a   Gomes, Ana P ^a   Pinheiro, Carlos B ^a   Ladeira, Luiz O ^a   Pimenta, Marcos A ^a   Neves, Bernardo R A ^a  

^a FEDERAL UNIVERSITY OF MINAS GERAIS   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

CONTROLLED GROWTHS; METAL NANOPARTICLES; METALLIC IONS; REGION OF INTERESTS; SCANNING PROBE MICROSCOPY TECHNIQUES; SCANNING PROBES; SURFACE-ENHANCED RAMAN SPECTROSCOPIES; X- RAY DIFFRACTIONS;

CARBON NANOTUBES; METALLIC COMPOUNDS; METALS; NANOPARTICLES; PROBES; SCANNING; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY;

PROCESS CONTROL;

CARBON NANOTUBE; METAL; METAL NANOPARTICLE; POLYMER; SILVER;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; RAMAN SPECTROMETRY; SCANNING PROBE MICROSCOPY; SURFACE PROPERTY; X RAY DIFFRACTION;

MATERIALS TESTING; METAL NANOPARTICLES; METALS; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, SCANNING PROBE; NANOTECHNOLOGY; NANOTUBES, CARBON; POLYMERS; SILVER; SPECTRUM ANALYSIS, RAMAN; SURFACE PROPERTIES; X-RAY DIFFRACTION;

EID: 65249089293     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la900045f     Document Type: Article

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