Electrical properties and microstructural characterization of single ZnO nanowire sensor manufactured by FIB

Thin Solid Films

Volumn 517, Issue 14, 2009, Pages 4003-4006

  Yoon, Sang Won ^a   Seo, Jong Hyun ^a   Kim, Kyou Hyun ^a   Ahn, Jae Pyoung ^a   Seong, Tae Yeon ^b   Lee, Kon Bae ^c   Kwon, Hoon ^c  

^a Korea Institute of Science and Technology   (South Korea)

^b Korea University   (South Korea)

^c Kookmin University   (South Korea)

Author keywords

Conductivity; Electrical resistance; FIB; Pt deposition; Single nanowire sensor

Indexed keywords

CONDUCTIVITY; ELECTRICAL RESISTANCE; FIB; PT DEPOSITION; SINGLE NANOWIRE SENSOR;

AMORPHOUS CARBON; ELECTRIC PROPERTIES; ELECTRIC RESISTANCE; FOCUSED ION BEAMS; GOLD; MANIPULATORS; NANOPARTICLES; NANOSENSORS; NANOWIRES; PLATINUM; SEMICONDUCTING ZINC COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; ZINC OXIDE;

ELECTRIC WIRE;

EID: 65149100007     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.01.168     Document Type: Article

References (12)

1. Cha J.E.J.S.N., Choi Y., and Amaratunga A.J. Appl. Phys. Lett. 89 (2007) 263102
2. Hannes Kind H.Y., Messer B., Law M., and Yang P. Adv. Mater. 14 (2002) 158
3. Min-Hua Zhao Z.-L.W., and Mao S.X. Nano Letters 4 (2004) 587
4. Arnold A.P., Pan M., and Wang Z.W. J. Phys. Chem. B 107 (2003) 659
5. Ismail M.A.A.B., and Rezig B. Thin Solid Films 383 (2001) 92-94
6. Thelander T.M.C., Bjork M.T., Ohlsson B.J., Larsson M.W., Wallenberg L.R., and Samuelson L. Appl. Phys. Lett. 83 (2003) 2052
7. Po-Wen Chiu K.-J.C., and Lin C.-Y. Appl. Phys. Lett. 92 (2008) 152111
8. Hernandez-Ramirez A.T.F., Casals O., Pellicer E., Rodriguez J., Romano-Rodriguez A., Morante J.R., Barth S., and Mathur S. Phys. Rev. B 76 (2007) 085429
9. Melngailis A.J.D.A.J. J. Vac. Sci. Technol. B 19 (2001) 2543
10. YenFu Lin W.-B.J., Wang C.P., Suen Y.-W., Wu Z.-Y., Chen F.-R., Kai J.-J., and Lin J.-L. Appl. Phys. Lett. 90 (2007) 223117
11. Teller R.A. J. Chem. Phys. 6 (1939) 489
12. Teller R.A. J. Chem. Phys. 6 (1939) 199