Latent tracks in CaF2 studied with atomic force microscopy in air and in vacuum

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 245, Issue 1, 2006, Pages 246-249

  Khalfaoui, N ^a   Gorlich M ^b   Muller C ^c   Schleberger, M ^b   Lebius, H ^a  

^a Centre Interdisciplinaire de Recherche Ions Lasers   (France)

^b UNIVERSITY OF DUISBURG ESSEN   (Germany)

^c GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH   (Germany)

Author keywords

CaF2; Scanning force microscopy; Swift heavy ion tracks; UHV

Indexed keywords

AIR; ATOMIC FORCE MICROSCOPY; BISMUTH ALLOYS; ELASTICITY; IMAGING TECHNIQUES; ION BOMBARDMENT; VACUUM;

CAF2; SCANNING FORCE MICROSCOPY; SWIFT HEAVY ION TRACKS; UHV;

CALCIUM COMPOUNDS;

EID: 33644530078     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.11.138     Document Type: Conference Paper

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