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Applied Physics Letters

Volumn 94, Issue 13, 2009, Pages

Surface passivation and interface reactions induced by hydrogen peroxide treatment of n -type ZnO ( 000 1̄)

(4) Schifano, R a Monakhov, E V a Svensson, B G a Diplas, S b

a UNIVERSITY OF OSLO (Norway)

b SINTEF MATERIALS AND CHEMISTRY (Norway)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL MEASUREMENTS; ENERGY-BAND BENDING; HIGH CONCENTRATIONS; HYDROGEN PEROXIDE TREATMENTS; INTERFACE REACTIONS; ORDERS OF MAGNITUDES; REVERSE BIAS VOLTAGES; SCHOTTKY BARRIER HEIGHTS; SCHOTTKY CONTACTS; SURFACE LAYERS; SURFACE LEAKAGE CURRENTS; SURFACE PASSIVATIONS; X-RAY PHOTOEMISSION SPECTROSCOPIES; ZINC VACANCIES; ZNO;

ELECTRIC RECTIFIERS; EMISSION SPECTROSCOPY; HYDROGEN; HYDROGEN PEROXIDE; OXIDATION; OXYGEN; PALLADIUM; PASSIVATION; SCHOTTKY BARRIER DIODES; SEMICONDUCTING ZINC COMPOUNDS; SURFACE TREATMENT; ZINC; ZINC OXIDE;

SURFACE REACTIONS;

EID: 64149131696 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3106052 Document Type: Article

Times cited : (45)

References (23)

1
- 85013840926
- (Elsevier, Oxford).
- C. Jagadish and S. J. Pearton, Zinc Oxide Bulk, Thin Films and Nanostructures (Elsevier, Oxford, 2006).
- (2006) Zinc Oxide Bulk, Thin Films and Nanostructures
- Jagadish, C.¹ Pearton, S.J.²

2
- 25144462707
- 0021-8979 10.1063/1.1992666.
- Ü. Özgür, Y. I. Alivov, C. Liu, A. Teke, M. A. Reshchikov, S. Doǧan, V. Avrutin, S. -J. Cho, and H. Morko̧, J. Appl. Phys. 0021-8979 10.1063/1.1992666 98, 041301 (2005).
- (2005) J. Appl. Phys. , vol.98 , pp. 041301
- Özgür, Ü.¹ Alivov, Y.I.² Liu, C.³ Teke, A.⁴ Reshchikov, M.A.⁵ Doǧan, S.⁶ Avrutin, V.⁷ Cho, S.-J.⁸ Morko̧, H.⁹

3
- 6444220325
- 0079-6425 10.1016/j.pmatsci.2004.04.001.
- S. Pearton, D. Norton, K. Ip, Y. Heo, and T. Steiner, Prog. Mater. Sci. 0079-6425 10.1016/j.pmatsci.2004.04.001 50, 293 (2005).
- (2005) Prog. Mater. Sci. , vol.50 , pp. 293
- Pearton, S.¹ Norton, D.² Ip, K.³ Heo, Y.⁴ Steiner, T.⁵

4
- 41349116132
- 0003-6951 10.1063/1.2903505.
- D. C. Look, B. Claflin, and H. E. Smith, Appl. Phys. Lett. 0003-6951 10.1063/1.2903505 92, 122108 (2008).
- (2008) Appl. Phys. Lett. , vol.92 , pp. 122108
- Look, D.C.¹ Claflin, B.² Smith, H.E.³

5
- 79956015333
- 0003-6951 10.1063/1.1463700.
- H. Sheng, S. Muthukumar, N. W. Emanetoglu, and Y. Lu, Appl. Phys. Lett. 0003-6951 10.1063/1.1463700 80, 2132 (2002).
- (2002) Appl. Phys. Lett. , vol.80 , pp. 2132
- Sheng, H.¹ Muthukumar, S.² Emanetoglu, N.W.³ Lu, Y.⁴

6
- 33947147840
- 0003-6951 10.1063/1.2711536.
- L. J. Brillson, H. L. Mosbacker, M. J. Hetzer, Y. Strzhemechny, G. H. Jessen, D. C. Look, G. Cantwell, J. Zhang, and J. J. Song, Appl. Phys. Lett. 0003-6951 10.1063/1.2711536 90, 102116 (2007).
- (2007) Appl. Phys. Lett. , vol.90 , pp. 102116
- Brillson, L.J.¹ Mosbacker, H.L.² Hetzer, M.J.³ Strzhemechny, Y.⁴ Jessen, G.H.⁵ Look, D.C.⁶ Cantwell, G.⁷ Zhang, J.⁸ Song, J.J.⁹

7
- 0042281615
- 0003-6951 10.1063/1.1604173.
- A. Y. Polyakov, N. B. Smirnov, E. A. Kozhukhova, V. I. Vdovin, K. Ip, Y. W. Heo, D. P. Norton, and S. J. Pearton, Appl. Phys. Lett. 0003-6951 10.1063/1.1604173 83, 1575 (2003).
- (2003) Appl. Phys. Lett. , vol.83 , pp. 1575
- Polyakov, A.Y.¹ Smirnov, N.B.² Kozhukhova, E.A.³ Vdovin, V.I.⁴ Ip, K.⁵ Heo, Y.W.⁶ Norton, D.P.⁷ Pearton, S.J.⁸

8
- 24144453586
- 0003-6951 10.1063/1.1984089.
- H. L. Mosbacker, Y. M. Strzhemechny, B. D. White, P. E. Smith, D. C. Look, D. C. Reynolds, C. W. Litton, and L. J. Brillson, Appl. Phys. Lett. 0003-6951 10.1063/1.1984089 87, 012102 (2005).
- (2005) Appl. Phys. Lett. , vol.87 , pp. 012102
- Mosbacker, H.L.¹ Strzhemechny, Y.M.² White, B.D.³ Smith, P.E.⁴ Look, D.C.⁵ Reynolds, D.C.⁶ Litton, C.W.⁷ Brillson, L.J.⁸

9
- 0037455341
- 0003-6951 10.1063/1.1536264.
- B. J. Coppa, R. F. Davis, and R. J. Nemanich, Appl. Phys. Lett. 0003-6951 10.1063/1.1536264 82, 400 (2003).
- (2003) Appl. Phys. Lett. , vol.82 , pp. 400
- Coppa, B.J.¹ Davis, R.F.² Nemanich, R.J.³

10
- 33846964495
- 0003-6951 10.1063/1.2450642.
- M. W. Allen, P. Miller, R. J. Reeves, and S. M. Durbin, Appl. Phys. Lett. 0003-6951 10.1063/1.2450642 90, 062104 (2007).
- (2007) Appl. Phys. Lett. , vol.90 , pp. 062104
- Allen, M.W.¹ Miller, P.² Reeves, R.J.³ Durbin, S.M.⁴

11
- 50249121599
- 0003-6951 10.1063/1.2974983.
- Y. Dong, Z. -Q. Fang, D. C. Look, G. Cantwell, J. Zhang, J. J. Song, and L. J. Brillson, Appl. Phys. Lett. 0003-6951 10.1063/1.2974983 93, 072111 (2008).
- (2008) Appl. Phys. Lett. , vol.93 , pp. 072111
- Dong, Y.¹ Fang, Z.-Q.² Look, D.C.³ Cantwell, G.⁴ Zhang, J.⁵ Song, J.J.⁶ Brillson, L.J.⁷

12
- 17944372404
- 0003-6951 10.1063/1.1862772.
- S. Kim, H. Kim, and T. Seong, Appl. Phys. Lett. 0003-6951 10.1063/1.1862772 86, 112101 (2005).
- (2005) Appl. Phys. Lett. , vol.86 , pp. 112101
- Kim, S.¹ Kim, H.² Seong, T.³

13
- 33947590299
- 0003-6951 10.1063/1.2715025.
- Q. L. Gu, C. C. Ling, X. D. Cheng, A. M. C. Ng, C. D. Beling, S. Fung, A. B. Djurišić, L. W. Lu, G. Brauer, and H. C. Ong, Appl. Phys. Lett. 0003-6951 10.1063/1.2715025 90, 122101 (2007).
- (2007) Appl. Phys. Lett. , vol.90 , pp. 122101
- Gu, Q.L.¹ Ling, C.C.² Cheng, X.D.³ Ng, A.M.C.⁴ Beling, C.D.⁵ Fung, S.⁶ Djurišić, A.B.⁷ Lu, L.W.⁸ Brauer, G.⁹ Ong, H.C.¹⁰

14
- 36048975472
- 0003-6951 10.1063/1.2806194.
- R. Schifano, E. V. Monakhov, U. Grossner, and B. G. Svensson, Appl. Phys. Lett. 0003-6951 10.1063/1.2806194 91, 193507 (2007).
- (2007) Appl. Phys. Lett. , vol.91 , pp. 193507
- Schifano, R.¹ Monakhov, E.V.² Grossner, U.³ Svensson, B.G.⁴

15
- 0003902695
- National Institute of Standards and Technology, Gaithersburg, MD.
- C. J. Powell and A. Jablonski, NIST Inelastic-Mean-Free-Path Database-Version 1.1., National Institute of Standards and Technology, Gaithersburg, MD (2000).
- (2000) NIST Inelastic-Mean-Free-Path Database-Version 1.1
- Powell, C.J.¹ Jablonski, A.²

16
- 0001278377
- 0022-3654 10.1021/j100505a006.
- T. L. Barr, J. Phys. Chem. 0022-3654 10.1021/j100505a006 82, 1801 (1978).
- (1978) J. Phys. Chem. , vol.82 , pp. 1801
- Barr, T.L.¹

17
- 0003600525
- (Cambridge University Press, Cambridge),.
- V. E. Henrich and P. A. Cox, The Surface Science of Metal Oxides (Cambridge University Press, Cambridge, 1994), p. 296.
- (1994) The Surface Science of Metal Oxides , pp. 296
- Henrich, V.E.¹ Cox, P.A.²

18
- 64149115960
- (unpublished).
- R. Schifano, L. Vines, B. G. Svensson, W. Mtangi and F. D. Auret (unpublished).
- Schifano, R.¹ Vines, L.² Svensson, B.G.³ Mtangi, W.⁴ Auret, F.D.⁵

19
- 0003546026
- (Oxford University Press, Oxford).
- E. H. Rhoderick and R. H. Williams, The Metal-Semiconductors Contacts (Oxford University Press, Oxford, 1988).
- (1988) The Metal-Semiconductors Contacts
- Rhoderick, E.H.¹ Williams, R.H.²

20
- 54249133945
- 0031-8965 10.1002/pssa.200878862.
- R. Schifano, E. V. Monakhov, J. S. Christensen, A. Y. Kuznetsov, and B. G. Svensson, Phys. Status Solidi A 0031-8965 10.1002/pssa.200878862 205, 1998 (2008).
- (2008) Phys. Status Solidi A , vol.205 , pp. 1998
- Schifano, R.¹ Monakhov, E.V.² Christensen, J.S.³ Kuznetsov, A.Y.⁴ Svensson, B.G.⁵

21
- 7044240930
- 0003-6951 10.1063/1.1790592.
- U. Grossner, S. Gabrielsen, T. M. Børseth, J. Grillenberger, A. Y. Kuznetsov, and B. G. Svensson, Appl. Phys. Lett. 0003-6951 10.1063/1.1790592 85, 2259 (2004).
- (2004) Appl. Phys. Lett. , vol.85 , pp. 2259
- Grossner, U.¹ Gabrielsen, S.² Børseth, T.M.³ Grillenberger, J.⁴ Kuznetsov, A.Y.⁵ Svensson, B.G.⁶

22
- 0002131698
- 0368-2048 10.1016/S0368-2048(98)00312-0.
- M. Brun, A. Berthet, and J. Bertolini, J. Electron Spectrosc. Relat. Phenom. 0368-2048 10.1016/S0368-2048(98)00312-0 104, 55 (1999).
- (1999) J. Electron Spectrosc. Relat. Phenom. , vol.104 , pp. 55
- Brun, M.¹ Berthet, A.² Bertolini, J.³

23
- 1642415657
- 0163-1829 10.1103/PhysRevB.69.075421.
- J. Rogal, K. Reuter, and M. Scheffler, Phys. Rev. B 0163-1829 10.1103/PhysRevB.69.075421 69, 075421 (2004).
- (2004) Phys. Rev. B , vol.69 , pp. 075421
- Rogal, J.¹ Reuter, K.² Scheffler, M.³

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