High resolution study of etch figures on CaF2 (111)

Journal of Applied Physics

Volumn 105, Issue 6, 2009, Pages

  Motzer, Christian ^a   Reichling, Michael ^a  

^a UNIVERSITY OF OSNABRÜCK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; DIFLUORIDE; DISSOLUTION MECHANISMS; ELEVATED TEMPERATURES; ETCH-PITS; EX-SITU; FORCE MICROSCOPIES; HIGH RESOLUTIONS; KINETIC DATUM; NANO-METER SCALE; ORTHOPHOSPHORIC ACIDS; QUANTITATIVE MEASUREMENTS; REACTION-RATE; SCALEABLE; SCANNING FORCE MICROSCOPIES; SITE-SELECTIVE;

ACIDS; CALCIUM; DISLOCATIONS (CRYSTALS); ETCHING; NITRIC ACID; PHOSPHORIC ACID; SCANNING; SCANNING TUNNELING MICROSCOPY; SOIL CONSERVATION; SULFURIC ACID;

DISSOLUTION;

EID: 63749088236     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3078774     Document Type: Article

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