On-wafer measurement of transistor noise parameters at NIST

IEEE Transactions on Instrumentation and Measurement

Volumn 56, Issue 2, 2007, Pages 551-554

  Randa, James ^a   Walker, David K ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Noise measurement; On wafer measurement; Transistor noise parameters; Uncertainty analysis

Indexed keywords

REFLECTION; SPURIOUS SIGNAL NOISE; STANDARDS; TRANSISTORS; UNCERTAINTY ANALYSIS;

ON-WAFER MEASUREMENT; TRANSISTOR NOISE PARAMETERS;

SIGNAL NOISE MEASUREMENT;

EID: 34047239829     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2007.891145     Document Type: Conference Paper

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