Noise-parameter measurement with automated variable terminations

CPEM Digest (Conference on Precision Electromagnetic Measurements)

Volumn , Issue , 2008, Pages 706-707

  Gu, Dazhen ^a   Walker, David K ^a   Randa, James ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); AUDIO FREQUENCY AMPLIFIERS; ELECTROMAGNETISM; PARAMETER ESTIMATION; TEMPERATURE MEASUREMENT;

ELECTROMAGNETIC MEASUREMENTS; FREQUENCY RANGING; MEAS URED RESULTS; NOISE PARAMETERS; PARAMETER MEASUREMENTS; TIME EFFICIENCIES;

LOW NOISE AMPLIFIERS;

EID: 51949094153     PISSN: 05891485     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CPEM.2008.4574975     Document Type: Conference Paper

References (3)

1. D. Wait and J. Randa, "Amplifier noise measurement at NIST," IEEE Trans. Instrum. And Meas., vol. 46, no. 2, pp. 482-485, April 1997.
2. J. Randa and D. K. Walker, "On-wafer measurement of transistor noise parameters at NIST," IEEE Trans. Instrum. And Meas., vol. 56, no. 2, pp. 551-554, April 2007.
3. J. Randa, "Noise-parameter uncertainties: A Monte Carlo simulation," J. Res. Nat. Inst. Stand. Technol., Vol. 107, no. 5, pp. 431-444, 2002